Spectroscopy and Scientific Instrumentation
原子力显微镜近场拉曼光谱
AFM-TERSAtomic Force Microscopy (AFM) combined with Tip-Enhanced Raman Spectroscopy (TERS) / 原子力显微镜（AFM）与探针增强拉曼光谱（TERS）的结合
- Knowledge type
- 物理设备
- First proposed or discovered
- Proposer
- Turkey Farm member
- Creator
- 农场主
- Last updated
- 2026-11-09 18:05:32
Sub-knowledge points
Near-field and far-field assessmentCommissioning-oriented workflowPlanar gold thin films substrate
Higher-order knowledge points
No connected node yet
Main parameters and performance indicators
AFM: Scanning probe microscopy techniqueTERS: Raman spectroscopy with plasmonic enhancementPlanar gold thin films: Substrate for the deviceBenchmark dyes: Analytical standards for assessment
Open problems
No unresolved problem recorded yet
Related literature
ranked by community starsCommissioning-oriented AFM-TERS workflow on planar gold thin films using benchmark dyes and near-/far-field assessmentOpen source
Related products and links
No item recorded yet
Creation and modification trail
1 recordsRecord title: AFM-TERS.
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