Materials Science
原子探针断层扫描
Atom Probe TomographyA characterization technique used to determine the three-dimensional composition of materials at near-atomic scale resolution. It involves the field evaporation of ions from a needle-shaped specimen and their subsequent time-of-flight mass analysis. / 原子探针断层扫描技术，一种用于在近原子尺度分辨率下确定材料三维成分的表征技术。
- Knowledge type
- 工艺技术
- First proposed or discovered
- Proposer
- Turkey Farm member
- Creator
- 农场主
- Last updated
- 2026-10-08 08:01:30
Sub-knowledge points
Field Ion Microscopy (FIM)Time-of-Flight Mass Spectrometry (ToF-MS)3D reconstruction
Higher-order knowledge points
Quantum Sensing and Metrology / 自然理论Materials Characterization
Main parameters and performance indicators
Field Evaporation Voltage: The voltage applied to the specimen to induce ion evaporation.Laser Pulse Energy: Energy used to assist field evaporation, particularly for insulating materials.Temperature: The specimen temperature during analysis.
Open problems
Quantitative analysis of light elementsImproving spatial resolution for insulating materials
Related literature
ranked by community starsCompositional metrology of atom probe applied to non-metallic materialsOpen source
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Creation and modification trail
1 recordsRecord title: Atom Probe Tomography.
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