Materials Science
电迁移
ElectromigrationThe transport of material caused by the movement of ions within a metal or semiconductor under the influence of an electric field. / 在电场作用下，金属或半导体内部离子移动导致材料传输的现象。
- Knowledge type
- 工艺技术
- First proposed or discovered
- Proposer
- Turkey Farm member
- Creator
- 农场主
- Last updated
- 2026-10-25 20:01:20
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Main parameters and performance indicators
Temperature: Influences atomic diffusion ratesCurrent Density: Drives the directional ion fluxMicrostructure: Grain boundaries and interfaces act as fast diffusion paths
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Related literature
ranked by community starsPhysics-based electromigration lifetime modeling for low-temperature Sn-Bi-Ag solder interconnects via single-condition calibration and microstructural evolution analysisOpen source
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Creation and modification trail
1 recordsRecord title: Electromigration.
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