Applied Acoustics
双快速扫描声学显微镜
Dual-Fast Scanning Acoustic MicroscopyA high-speed dual-side ultrasound imaging system for thick sample inspection / 一种用于厚样品检测的高速双面超声成像系统
- Knowledge type
- 物理设备
- First proposed or discovered
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- Turkey Farm member
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- 农场主
- Last updated
- 2026-10-27 16:01:53
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Main parameters and performance indicators
Dual-side scanning: Enables imaging from both sides of the sampleHigh-speed: Facilitates rapid inspection processesThick sample inspection: Capable of analyzing materials with significant thickness
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Related literature
ranked by community starsDual-Fast Scanning Acoustic Microscopy (DFSAM): a high-speed dual-side ultrasound imaging system for thick sample inspectionOpen source
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1 recordsRecord title: Dual-Fast Scanning Acoustic Microscopy.
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