Radiation Physics and Chemistry
单粒子效应
Single-event effectsSingle-event effects (SEEs) are a class of transient or permanent malfunctions in electronic devices caused by the interaction of a single ionizing particle (such as a neutron, proton, or heavy ion) with the device's sensitive volume. / 单粒子效应（SEE）是指由单个电离粒子（如中子、质子或重离子）与器件敏感区相互作用引起的电子器件瞬态或永久性故障。
- Knowledge type
- 自然理论
- First proposed or discovered
- Proposer
- Turkey Farm member
- Creator
- 农场主
- Last updated
- 2026-10-27 20:00:55
Sub-knowledge points
Single-event upset (SEU)Single-event transient (SET)Single-event latchup (SEL)
Higher-order knowledge points
Radiation effects on integrated circuitsRadiation hardening of electronicsSpacecraft electronics reliability
Main parameters and performance indicators
Particle type: Ionizing particle (neutron, proton, heavy ion)Device type: SRAM-based FPGAConfiguration mode: Active vs. Configuration
Open problems
Mechanism of sensitivity under different configuration modesLong-term reliability under radiation environments
Related literature
ranked by community starsSingle-event effects sensitivity and mechanism analysis of SRAM-based FPGA under different configuration modesOpen source
Related products and links
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Creation and modification trail
1 recordsRecord title: Single-event effects.
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