Optics and Metrology
光学亚像素计量
Optical Sub-pixel MetrologyA measurement technique that utilizes optical systems to determine the position of an object with precision finer than the optical system's diffraction limit or pixel size. / 一种利用光学系统确定物体位置的技术，其精度优于光学系统的衍射极限或像素尺寸。
- Knowledge type
- 实际应用
- First proposed or discovered
- Proposer
- Turkey Farm member
- Creator
- 农场主
- Last updated
- 2026-11-05 18:06:13
Sub-knowledge points
Frequency-domain deblurringComposite degradation modelingCalibration-preserving algorithms
Higher-order knowledge points
Quantum Sensing and Metrology / 自然理论Optical Imaging
Main parameters and performance indicators
Pixel Size: The discrete sampling interval of the imaging sensor.Diffraction Limit: The smallest resolvable feature size determined by the optical system's aperture.Deblurring Kernel: A mathematical model representing the optical system's point spread function.
Open problems
Robustness under varying environmental conditions.Real-time processing requirements for high-speed applications.
Related literature
ranked by community starsCalibration-preserving frequency-domain deblurring for optical sub-pixel metrology under composite degradationOpen source
Related products and links
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Creation and modification trail
1 recordsRecord title: Optical Sub-pixel Metrology.
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