Spectroscopy and Scientific Instrumentation
原子力显微镜红外光谱
AFM-IRAtomic Force Microscopy-based Infrared Spectroscopy (AFM-IR) is a nanoscale spectroscopy technique that combines atomic force microscopy with infrared spectroscopy to characterize chemical bonds and materials at the nanometer scale. / 原子力显微镜红外光谱（AFM-IR）是一种纳米级光谱技术，结合了原子力显微镜与红外光谱，用于在纳米尺度上表征化学键和材料。
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- 2026-11-05 22:06:09
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ranked by community starsPre-damage chemical bond evolution of laser-irradiated nano-defects characterized by Atomic force Microscopy-based infrared spectroscopy (AFM-IR)Open source
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1 recordsRecord title: AFM-IR.
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