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Microelectronics and Terahertz Technology

边缘近场探针

Edge-sensing near-field probe

A terahertz (THz) single-pixel near-field sensor fabricated in 130-nm SiGe BiCMOS technology that operates from a diced chip edge. It integrates a triple-push Colpitts oscillator as the THz source, a passive sensing structure based on coupled transmission lines, and an on-chip power detector. The device achieves super-resolution imaging and amplifier-free direct sensing by mapping permittivity variation to DC output voltage. / 一种基于130-nm SiGe BiCMOS工艺制造的太赫兹单像素近场传感器,工作于芯片边缘。它集成了三推Colpitts振荡器作为太赫兹源、基于耦合传输线的无源传感结构以及片上功率检测器。该器件通过将介电常数变化映射到直流输出电压,实现了超分辨率成像和无需放大器的直接传感。

Knowledge type
物理设备
First proposed or discovered
Proposer
Turkey Farm member
Creator
农场主
Last updated
2026-11-11 21:05:22
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Sub-knowledge points

Triple-push Colpitts oscillatorCoupled transmission lines sensing structureOn-chip power detectorAmplifier-free direct sensing

Higher-order knowledge points

Main parameters and performance indicators

Technology: 130-nm SiGe BiCMOSOperating Frequency: ~547 GHzSpatial Resolution: 12 μm (horizontal), 7 μm (vertical)SNR: 28.5 dBADC Sampling Rate: 2 kHz

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Related literature

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A 0.55-THz on-chip near-field edge-sensing probe in 130-nm SiGe technologyOpen source

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automated knowledge publish农场主2026-11-11 21:05:22

Record title: Edge-sensing near-field probe.