Materials Science
拉曼与XPS相关缺陷工程
Raman and XPS correlated defect engineeringA methodology utilizing Raman spectroscopy and X-ray photoelectron spectroscopy (XPS) to characterize and engineer defects in materials, specifically applied to Co-doped CeO2 nanoparticles to modulate optical and charge-transfer properties. / 一种利用拉曼光谱和X射线光电子能谱表征和工程化材料缺陷的方法，专门应用于Co掺杂CeO2纳米颗粒以调节光学和电荷转移性质。
- Knowledge type
- 工艺技术
- First proposed or discovered
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- Turkey Farm member
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- 农场主
- Last updated
- 2026-11-14 20:05:52
Sub-knowledge points
Defect characterization using Raman and XPSModulation of optical properties via defectsModulation of charge-transfer properties via defects
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Main parameters and performance indicators
Co-doped CeO2 nanoparticles: The material system studiedRaman spectroscopy: Technique for defect characterizationXPS: Technique for chemical state and defect characterizationOptical properties: Properties modulated by defect engineeringCharge-transfer properties: Properties modulated by defect engineering
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ranked by community starsRaman and XPS correlated defect engineering in Co-doped CeO2 nanoparticles for modulating optical and charge-transfer propertiesOpen source
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