Electronics
栅极漏电
Gate leakageThe flow of electric current through the insulating gate dielectric layer of a transistor, which can degrade device performance and reliability. / 晶体管绝缘栅介质层中的电流流动，这可能会降低器件性能和可靠性。
- Knowledge type
- 物理设备
- First proposed or discovered
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- Turkey Farm member
- Creator
- 农场主
- Last updated
- 2026-10-23 23:01:07
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Main parameters and performance indicators
pHEMT: Pseudomorphic High Electron Mobility Transistorgate leakage current: Current flowing through the gate dielectric
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Related literature
ranked by community starsNeural-network compact modeling of gate leakage in pHEMTs across two epitaxial technologiesOpen source
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1 recordsRecord title: Gate leakage.
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