Particle Physics
单粒子翻转
Single-event upsetA single-event upset (SEU) is a change of the state of a memory cell caused by physical interaction of a single energetic particle with the cell. / 单粒子翻转（SEU）是指单个高能粒子与存储单元发生物理相互作用导致存储单元状态发生改变的现象。
- Knowledge type
- 自然理论
- First proposed or discovered
- Proposer
- Turkey Farm member
- Creator
- 农场主
- Last updated
- 2026-11-01 17:05:46
Sub-knowledge points
SEU in pixel frontend configuration registersTriple modular redundancy (TMR) protectionConfiguration programming and readback comparisons
Higher-order knowledge points
High luminosity large hadron collider (HL-LHC) operationInner tracker (ITk) pixel readout reliability
Main parameters and performance indicators
SEU cross section (σ SEU): Probability of upset per unit fluenceIrradiation energy: 24 GeV protonsTMR protection: Triple modular redundancy scheme
Open problems
Optimizing mitigation techniques for high-luminosity environmentsPredicting upset rates under complex radiation conditions
Related literature
ranked by community starsSingle-event upset response of the ITkPixV1.1 pixel readout chip with 24 GeV proton irradiationOpen source
Related products and links
ITkPixV1.1 pixel readout chip
Creation and modification trail
1 recordsRecord title: Single-event upset.
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